Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 2

Search results for: TFT-LCD

2 An Analytical Framework for Multi-Site Supply Chain Planning Problems

Authors: Yin-Yann Chen

Abstract:

As the gradual increase of the enterprise scale, the firms may possess many manufacturing plants located in different places geographically. This change will result in the multi-site production planning problems under the environment of multiple plants or production resources. Our research proposes the structural framework to analyze the multi-site planning problems. The analytical framework is composed of six elements: multi-site conceptual model, product structure (bill of manufacturing), production strategy, manufacturing capability and characteristics, production planning constraints, and key performance indicators. As well as the discussion of these six ingredients, we also review related literatures in this paper to match our analytical framework. Finally we take a real-world practical example of a TFT-LCD manufacturer in Taiwan to explain our proposed analytical framework for the multi-site production planning problems.

Keywords: Supply Chain, Production Planning, TFT-LCD, Multi-Site

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1 Geometric Modeling of Illumination on the TFT-LCD Panel using Bezier Surface

Authors: Kyong-min Lee, Moon Soo Chang, PooGyeon Park

Abstract:

In this paper, we propose a geometric modeling of illumination on the patterned image containing etching transistor. This image is captured by a commercial camera during the inspection of a TFT-LCD panel. Inspection of defect is an important process in the production of LCD panel, but the regional difference in brightness, which has a negative effect on the inspection, is due to the uneven illumination environment. In order to solve this problem, we present a geometric modeling of illumination consisting of an interpolation using the least squares method and 3D modeling using bezier surface. Our computational time, by using the sampling method, is shorter than the previous methods. Moreover, it can be further used to correct brightness in every patterned image.

Keywords: Illumination, Inspection, Geometric Modeling, defect, panel, LCD, Bezier

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