Search results for: Luc Beaulieu
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 2

Search results for: Luc Beaulieu

2 Artifacts in Spiral X-ray CT Scanners: Problems and Solutions

Authors: Mehran Yazdi, Luc Beaulieu

Abstract:

Artifact is one of the most important factors in degrading the CT image quality and plays an important role in diagnostic accuracy. In this paper, some artifacts typically appear in Spiral CT are introduced. The different factors such as patient, equipment and interpolation algorithm which cause the artifacts are discussed and new developments and image processing algorithms to prevent or reduce them are presented.

Keywords: CT artifacts, Spiral CT, Artifact removal.

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1 Spatial Correlation of Channel State Information in Real LoRa Measurement

Authors: Ahmed Abdelghany, Bernard Uguen, Christophe Moy, Dominique Lemur

Abstract:

The Internet of Things (IoT) is developed to ensure monitoring and connectivity within different applications. Thus, it is critical to study the channel propagation characteristics in Low Power Wide Area Network (LPWAN), especially LoRaWAN. In this paper, an in-depth investigation of the reciprocity between the uplink and downlink Channel State Information (CSI) is done by performing an outdoor measurement campaign in the area of Campus Beaulieu in Rennes. At each different location, the CSI reciprocity is quantified using the Pearson Correlation Coefficient (PCC) which shows a very high linear correlation between the uplink and downlink CSI. This reciprocity feature could be utilized for the physical layer security between the node and the gateway. On the other hand, most of the CSI shapes from different locations are highly uncorrelated with each other. Hence, it can be anticipated that this could achieve significant localization gain by utilizing the frequency hopping in the LoRa systems to get access to a wider band.

Keywords: IoT, LPWAN, LoRa, RSSI, effective signal power, onsite measurement, smart city, channel reciprocity.

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