Search results for: Hongzhi Li

Authors: Hongzhi Wang, Jianzhong Li, Jizhou Luo

Abstract:

In many applications, data is in graph structure, which can be naturally represented as graph-structured XML. Existing queries defined on tree-structured and graph-structured XML data mainly focus on subgraph matching, which can not cover all the requirements of querying on graph. In this paper, a new kind of queries, topological query on graph-structured XML is presented. This kind of queries consider not only the structure of subgraph but also the topological relationship between subgraphs. With existing subgraph query processing algorithms, efficient algorithms for topological query processing are designed. Experimental results show the efficiency of implementation algorithms.

Keywords: XML, Graph Structure, Topological query.

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Authors: Hongzhi Wang, Jianzhong Li, Hong Gao

Abstract:

XML is an important standard of data exchange and representation. As a mature database system, using relational database to support XML data may bring some advantages. But storing XML in relational database has obvious redundancy that wastes disk space, bandwidth and disk I/O when querying XML data. For the efficiency of storage and query XML, it is necessary to use compressed XML data in relational database. In this paper, a compressed relational database technology supporting XML data is presented. Original relational storage structure is adaptive to XPath query process. The compression method keeps this feature. Besides traditional relational database techniques, additional query process technologies on compressed relations and for special structure for XML are presented. In this paper, technologies for XQuery process in compressed relational database are presented..

Keywords: XML, compression, query processing

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Authors: Jinyong Yao, Hongzhi Li, Chao Du, Jiao Li

Abstract:

Reliability of long-term storage products is related to the availability of the whole system, and the evaluation of storage life is of great necessity. These products are usually highly reliable and little failure information can be collected. In this paper, an analytical method based on data from accelerated storage life test is proposed to evaluate the reliability index of the long-term storage products. Firstly, singularities are eliminated by data normalization and residual analysis. Secondly, with the preprocessed data, the degradation path model is built to obtain the pseudo life values. Then by life distribution hypothesis, we can get the estimator of parameters in high stress levels and verify failure mechanism consistency. Finally, the life distribution under the normal stress level is extrapolated via the acceleration model and evaluation of the actual average life is available. An application example with the camera stabilization device is provided to illustrate the methodology we proposed.

Keywords: Accelerated storage life test, failure mechanism consistency, life distribution, reliability.

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