Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 4

RBS Related Publications

4 Evaluation of Seismic Parameters and Response Modification Factor of Connections in Reduced Beam Section

Authors: Elmira Tavasoli Yousef Abadi

Abstract:

All structural components influencing the inelastic analysis alter response modification factor too. Ductility of connections has been regarded among the factors which have a direct impact on steel frame response modification factor. The experience of recent earthquakes such as the 1994 Northridge earthquake showed that structural connections in steel frame incurred unexpected (brittle) fracture in beam-to-column connection area. One of the methods to improve performance of moment frames is to reduce the beam section near the connection to the column. Reduced Beam Section (RBS) refers to one of the proposed moment connections in FEMA350. Ductility is the most important advantage of this connection over the other moment connections; it is found as the major factor in suitable plastic behavior of structural system. In this paper, beam-to-column connection with RBS and wide-flange beams has been examined via software Abaqus 6.12. It is observed that use of RBS connections can improve the connection behavior at inelastic area to a large extent and avoid stress concentrations and large deformation in the column.

Keywords: Seismic Performance, Ductility, RBS, beam-to-column connection, wide-flange beam

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3 RBS Characteristic of Cd1−xZnxS Thin Film Fabricated by Vacuum Deposition Method

Authors: N. Dahbi, D-E. Arafah

Abstract:

Cd1−xZnxS thins films have been fabricated from ZnS/CdS/ZnS multilayer thin film systems, by using the vacuum deposition method; the Rutherford backscattering (RBS) technique have been applied in order to determine the: structure, composition, depth profile, and stoichiometric of these films. The influence of the chemical and heat treatments on the produced films also have been investigated; the RBS spectra of the films showed that homogenous Cd1−xZnxS can be synthesized with x=0.45.

Keywords: Heat Treatment, Chemical Treatment, thin film, Cd1−xZnxS, depth profile, RBS, RUMP simulation, vacuum deposition, ZnS/CdS/ZnS

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2 Study the Influence of Chemical Treatment on the Compositional Changes and Defect Structures of ZnS Thin Film

Authors: N. Dahbi, D-E. Arafah

Abstract:

The effect of chemical treatment in CdCl2 on the compositional changes and defect structures of potentially useful ZnS solar cell thin films prepared by vacuum deposition method was studied using the complementary Rutherford backscattering (RBS) and Thermoluminesence (TL) techniques. A series of electron and hole traps are found in the various as deposited samples studied. After treatment, perturbation on the intensity is noted; mobile defect states and charge conversion and/or transfer between defect states are found.

Keywords: Thermoluminescence, Chemical Treatment, RBS, vacuum deposition, defect, ZnS, glow curve, thinfilm

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1 Characterization of Microroughness Parameters in Cu and Cu2O Nanoparticles Embedded in Carbon Film

Authors: S.Solaymani, T.Ghodselahi, N.B.Nezafat, H.Zahrabi, A.Gelali

Abstract:

The morphological parameter of a thin film surface can be characterized by power spectral density (PSD) functions which provides a better description to the topography than the RMS roughness and imparts several useful information of the surface including fractal and superstructure contributions. Through the present study Nanoparticle copper/carbon composite films were prepared by co-deposition of RF-Sputtering and RF-PECVD method from acetylene gas and copper target. Surface morphology of thin films is characterized by using atomic force microscopy (AFM). The Carbon content of our films was obtained by Rutherford Back Scattering (RBS) and it varied from .4% to 78%. The power values of power spectral density (PSD) for the AFM data were determined by the fast Fourier transform (FFT) algorithms. We investigate the effect of carbon on the roughness of thin films surface. Using such information, roughness contributions of the surface have been successfully extracted.

Keywords: Atomic Force Microscopy, fast fourier transform, RBS, power spectral density

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