Search results for: Sekou Kangoye
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 2

Search results for: Sekou Kangoye

2 Automatic MC/DC Test Data Generation from Software Module Description

Authors: Sekou Kangoye, Alexis Todoskoff, Mihaela Barreau

Abstract:

Modified Condition/Decision Coverage (MC/DC) is a structural coverage criterion that is highly recommended or required for safety-critical software coverage. Therefore, many testing standards include this criterion and require it to be satisfied at a particular level of testing (e.g. validation and unit levels). However, an important amount of time is needed to meet those requirements. In this paper we propose to automate MC/DC test data generation. Thus, we present an approach to automatically generate MC/DC test data, from software module description written over a dedicated language. We introduce a new merging approach that provides high MC/DC coverage for the description, with only a little number of test cases.

Keywords: domain-specific language, MC/DC, test data generation, safety-critical software coverage

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1 Practical Methods for Automatic MC/DC Test Cases Generation of Boolean Expressions

Authors: Sekou Kangoye, Alexis Todoskoff, Mihaela Barreau

Abstract:

Modified Condition/Decision Coverage (MC/DC) is a structural coverage criterion that aims to prove that all conditions involved in a Boolean expression can influence the result of that expression. In the context of automotive, MC/DC is highly recommended and even required for most security and safety applications testing. However, due to complex Boolean expressions that often embedded in those applications, generating a set of MC/DC compliant test cases for any of these expressions is a nontrivial task and can be time consuming for testers. In this paper we present an approach to automatically generate MC/DC test cases for any Boolean expression. We introduce novel techniques, essentially based on binary trees to quickly and optimally generate MC/DC test cases for the expressions. Thus, the approach can be used to reduce the manual testing effort of testers.

Keywords: binary trees, MC/DC, test case generation, nontrivial task

Procedia PDF Downloads 395