Robert Setekera and  Luuk Tiemeijer and  Ramses van der Toorn,  Verification of the Simultaneous Local Extraction Method of Base and Thermal Resistance of Bipolar Transistors.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    September 2014, vol. 94(10). 1551 - 1555
    [viewed 05 August 2020]. Available from: https://publications.waset.org/pdf/9999395.