Robert Setekera and Luuk Tiemeijer and Ramses van der Toorn, Verification of the Simultaneous Local Extraction Method of Base and Thermal Resistance of Bipolar Transistors. journal = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology. September 2014, vol. 94(10). 1551 - 1555 [viewed 25 April 2024]. Available from: https://publications.waset.org/pdf/9999395.