Robert Setekera and  Luuk Tiemeijer and  Ramses van der Toorn,  Verification of the Simultaneous Local Extraction Method of Base and Thermal Resistance of Bipolar Transistors.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    September 2014, vol. 94(10). 1551 - 1555
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