%0 Journal Article
	%A N. Dahbi and  D-E. Arafah
	%D 2014
	%J International Journal of Materials and Metallurgical Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 85, 2014
	%T RBS Characteristic of Cd1−xZnxS Thin Film Fabricated by Vacuum Deposition Method
	%U https://publications.waset.org/pdf/9997254
	%V 85
	%X Cd1−xZnxS thins films have been fabricated from ZnS/CdS/ZnS multilayer thin film systems, by using the vacuum deposition method; the Rutherford backscattering (RBS) technique have been applied in order to determine the: structure, composition, depth profile, and stoichiometric of these films. The influence of the chemical and heat treatments on the produced films also have been investigated; the RBS spectra of the films showed that homogenous Cd1−xZnxS can be synthesized with x=0.45.

	%P 66 - 69