@article{(Open Science Index):https://publications.waset.org/pdf/9997080,
	  title     = {Leakage Reduction ONOFIC Approach for Deep Submicron VLSI Circuits Design},
	  author    = {Vijay Kumar Sharma and  Manisha Pattanaik and  Balwinder Raj},
	  country	= {},
	  institution	= {},
	  abstract     = {Minimizations of power dissipation, chip area with higher circuit performance are the necessary and key parameters in deep submicron regime. The leakage current increases sharply in deep submicron regime and directly affected the power dissipation of the logic circuits. In deep submicron region the power dissipation as well as high performance is the crucial concern since increasing importance of portable systems. Number of leakage reduction techniques employed to reduce the leakage current in deep submicron region but they have some trade-off to control the leakage current. ONOFIC approach gives an excellent agreement between power dissipation and propagation delay for designing the efficient CMOS logic circuits. In this article ONOFIC approach is compared with LECTOR technique and output results show that ONOFIC approach significantly reduces the power dissipation and enhance the speed of the logic circuits. The lower power delay product is the big outcome of this approach and makes it an influential leakage reduction technique.
},
	    journal   = {International Journal of Electrical and Computer Engineering},
	  volume    = {7},
	  number    = {4},
	  year      = {2013},
	  pages     = {453 - 458},
	  ee        = {https://publications.waset.org/pdf/9997080},
	  url   	= {https://publications.waset.org/vol/76},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 76, 2013},
	}