%0 Journal Article
	%A Saleh H. Abud and  Z. Hassan and  F. K. Yam
	%D 2013
	%J International Journal of Nuclear and Quantum Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 84, 2013
	%T Metal-Semiconductor-Metal Photodetector Based On Porous In0.08Ga0.92N
	%U https://publications.waset.org/pdf/9996801
	%V 84
	%X Characteristics of MSM photodetector based on a porous In0.08Ga0.92N thin film were reported. Nanoporous structures of n-type In0.08Ga0.92N/AlN/Si thin films were synthesized by photoelectrochemical (PEC) etching at a ratio of 1:4 of HF:C2H5OH solution for 15min. The structural and optical properties of pre- and post-etched thin films were investigated. Field emission scanning electron microscope and atomic force microscope images showed that the pre-etched thin film has a sufficiently smooth surface over a large region and the roughness increased for porous film. Blue shift has been observed in photoluminescence emission peak at 300 K for porous sample. The photoluminescence intensity of the porous film indicated that the optical properties have been enhanced. A high work function metals (Pt and Ni) were deposited as a metal contact on the porous films. The rise and recovery times of the devices were investigated at 390nm chopped light. Finally, the sensitivity and quantum efficiency were also studied.

	%P 1002 - 1004