@article{(Open Science Index):https://publications.waset.org/pdf/9656,
	  title     = {A Nano-Scaled SRAM Guard Band Design with Gaussian Mixtures Model of Complex Long Tail RTN Distributions},
	  author    = {Worawit Somha and  Hiroyuki Yamauchi},
	  country	= {},
	  institution	= {},
	  abstract     = {This paper proposes, for the first time, how the
challenges facing the guard-band designs including the margin
assist-circuits scheme for the screening-test in the coming process
generations should be addressed. The increased screening error
impacts are discussed based on the proposed statistical analysis
models. It has been shown that the yield-loss caused by the
misjudgment on the screening test would become 5-orders of
magnitude larger than that for the conventional one when the
amplitude of random telegraph noise (RTN) caused variations
approaches to that of random dopant fluctuation. Three fitting methods
to approximate the RTN caused complex Gamma mixtures
distributions by the simple Gaussian mixtures model (GMM) are
proposed and compared. It has been verified that the proposed
methods can reduce the error of the fail-bit predictions by 4-orders of
magnitude.},
	    journal   = {International Journal of Electrical and Computer Engineering},
	  volume    = {7},
	  number    = {3},
	  year      = {2013},
	  pages     = {313 - 323},
	  ee        = {https://publications.waset.org/pdf/9656},
	  url   	= {https://publications.waset.org/vol/75},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 75, 2013},
	}