C. Chahin and  M. C. Hsu and  Y. H. Lin and  C. Y. Huang,  Using the Monte Carlo Simulation to Predict the Assembly Yield.   journal   = {International Journal of Information and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    March 2011, vol. 51(3). 605 - 608
    [viewed 24 April 2024]. Available from: https://publications.waset.org/pdf/8308.