%0 Journal Article
	%A Y. Bentoutou and  A.M. Si Mohammed
	%D 2012
	%J International Journal of Physical and Mathematical Sciences
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 66, 2012
	%T A Review of in-orbit Observations of Radiation- Induced Effects in Commercial Memories onboard Alsat-1
	%U https://publications.waset.org/pdf/8200
	%V 66
	%X This paper presents a review of an 8-year study on radiation effects in commercial memory devices operating within the main on-board computer system OBC386 of the Algerian microsatellite Alsat-1. A statistical analysis of single-event upset (SEU) and multiple-bit upset (MBU) activity in these commercial memories shows that the typical SEU rate at alsat-1's orbit is 4.04 × 10-7 SEU/bit/day, where 98.6% of these SEUs cause single-bit errors, 1.22% cause double-byte errors, and the remaining SEUs result in multiple-bit and severe errors.

	%P 652 - 654