Kyoung Kun Lee and  Soongyu Kwon and  Jong Tae Kim,  An Embedded System Design for SRAM SEU Test.   journal   = {International Journal of Computer and Information Engineering}, [online]. World Academy of Science, Engineering and Technology.
    December 2011, vol. 60(12). 1689 - 1692
    [viewed 23 April 2024]. Available from: https://publications.waset.org/pdf/7770.