Ashish R. Tanna and  Hiren H. Joshi,  Computer Aided X-Ray Diffraction Intensity Analysis for Spinels: Hands-On Computing Experience.   journal   = {International Journal of Physical and Mathematical Sciences}, [online]. World Academy of Science, Engineering and Technology.
    March 2013, vol. 75(3). 334 - 341
    [viewed 27 April 2024]. Available from: https://publications.waset.org/pdf/7497.