WASET
    Emanuele Stomeo and  Tatiana Kalganova and  Cyrille Lambert,  Mutation Rate for Evolvable Hardware.   journal   = {International Journal of Electrical and Computer Engineering}, [online]. World Academy of Science, Engineering and Technology.
    July 2007, vol. 7(7). 1055 - 1062
    [viewed 02 May 2024]. Available from: https://publications.waset.org/pdf/6198.