@article{(Open Science Index):https://publications.waset.org/pdf/5604,
	  title     = {Monitoring Patents Using the Statistical Process Control},
	  author    = {Stephanie Russo Fabris and  Edmara Thays Neres Menezes and  Ruirogeres dos Santos Cruz and  Lucio Leonardo Siqueira Santos and  Suzana Leitao Russo},
	  country	= {},
	  institution	= {},
	  abstract     = {The statistical process control (SPC) is one of the most powerful tools developed to assist ineffective control of quality, involves collecting, organizing and interpreting data during production. This article aims to show how the use of CEP industries can control and continuously improve product quality through monitoring of production that can detect deviations of parameters representing the process by reducing the amount of off-specification products and thus the costs of production. This study aimed to conduct a technological forecasting in order to characterize the research being done related to the CEP. The survey was conducted in the databases Spacenet, WIPO and the National Institute of Industrial Property (INPI). Among the largest are the United States depositors and deposits via PCT, the classification section that was presented in greater abundance to F.
	    journal   = {International Journal of Economics and Management Engineering},
	  volume    = {6},
	  number    = {7},
	  year      = {2012},
	  pages     = {1950 - 1953},
	  ee        = {https://publications.waset.org/pdf/5604},
	  url   	= {https://publications.waset.org/vol/67},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 67, 2012},