TY - JFULL AU - D. I. De Souza and G. P. Azevedo and D. R. Fonseca PY - 2012/10/ TI - Further Thoughtson a Sequential Life Testing Approach Using an Inverse Weibull Model T2 - International Journal of Mathematical and Computational Sciences SP - 1246 EP - 1250 VL - 6 SN - 1307-6892 UR - https://publications.waset.org/pdf/4564 PU - World Academy of Science, Engineering and Technology NX - Open Science Index 69, 2012 N2 - In this paper we will develop further the sequential life test approach presented in a previous article by [1] using an underlying two parameter Inverse Weibull sampling distribution. The location parameter or minimum life will be considered equal to zero. Once again we will provide rules for making one of the three possible decisions as each observation becomes available; that is: accept the null hypothesis H0; reject the null hypothesis H0; or obtain additional information by making another observation. The product being analyzed is a new electronic component. There is little information available about the possible values the parameters of the corresponding Inverse Weibull underlying sampling distribution could have.To estimate the shape and the scale parameters of the underlying Inverse Weibull model we will use a maximum likelihood approach for censored failure data. A new example will further develop the proposed sequential life testing approach. ER -