%0 Journal Article
	%A Zhen-Hui Hu and  Jyh-Shong Ju and  Ming-Hwei Perng
	%D 2008
	%J International Journal of Computer and Information Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 17, 2008
	%T A Sub-Pixel Image Registration Technique with Applications to Defect Detection
	%U https://publications.waset.org/pdf/3071
	%V 17
	%X This paper presents a useful sub-pixel image
registration method using line segments and a sub-pixel edge detector.
In this approach, straight line segments are first extracted from gray
images at the pixel level before applying the sub-pixel edge detector.
Next, all sub-pixel line edges are mapped onto the orientation-distance
parameter space to solve for line correspondence between images.
Finally, the registration parameters with sub-pixel accuracy are
analytically solved via two linear least-square problems. The present
approach can be applied to various fields where fast registration with
sub-pixel accuracy is required. To illustrate, the present approach is
applied to the inspection of printed circuits on a flat panel. Numerical
example shows that the present approach is effective and accurate
when target images contain a sufficient number of line segments,
which is true in many industrial problems.
	%P 1411 - 1416