%0 Journal Article
	%A Samy E. Oraby and  Ayman M. Alaskari
	%D 2010
	%J International Journal of Mechanical and Mechatronics Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 46, 2010
	%T Atomic Force Microscopy (AFM)Topographical Surface Characterization of Multilayer-Coated and Uncoated Carbide Inserts
	%U https://publications.waset.org/pdf/2584
	%V 46
	%X In recent years, scanning probe atomic force
microscopy SPM AFM has gained acceptance over a wide spectrum
of research and science applications. Most fields focuses on physical,
chemical, biological while less attention is devoted to manufacturing
and machining aspects. The purpose of the current study is to assess
the possible implementation of the SPM AFM features and its
NanoScope software in general machining applications with special
attention to the tribological aspects of cutting tool. The surface
morphology of coated and uncoated as-received carbide inserts is
examined, analyzed, and characterized through the determination of
the appropriate scanning setting, the suitable data type imaging
techniques and the most representative data analysis parameters
using the MultiMode SPM AFM in contact mode. The NanoScope
operating software is used to capture realtime three data types
images: “Height", “Deflection" and “Friction". Three scan sizes are
independently performed: 2, 6, and 12 μm with a 2.5 μm vertical
range (Z). Offline mode analysis includes the determination of three
functional topographical parameters: surface “Roughness", power
spectral density “PSD" and “Section". The 12 μm scan size in
association with “Height" imaging is found efficient to capture every
tiny features and tribological aspects of the examined surface. Also,
“Friction" analysis is found to produce a comprehensive explanation
about the lateral characteristics of the scanned surface. Configuration
of many surface defects and drawbacks has been precisely detected
and analyzed.
	%P 977 - 988