Ian Kree and  Davina Chin Lee Yien,  Wafer Fab Operational Cost Monitoring and Controlling with Cost per Equivalent Wafer Out.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    June 2010, vol. 42(6). 954 - 958
    [viewed 25 January 2020]. Available from: https://publications.waset.org/pdf/216.