@article{(Open Science Index):https://publications.waset.org/pdf/216,
	  title     = {Wafer Fab Operational Cost Monitoring and Controlling with Cost per Equivalent Wafer Out},
	  author    = {Ian Kree and  Davina Chin Lee Yien},
	  country	= {},
	  institution	= {},
	  abstract     = {This paper presents Cost per Equivalent Wafer Out, which we find useful in wafer fab operational cost monitoring and controlling. It removes the loading and product mix effect in the cost variance analysis. The operation heads, therefore, could immediately focus on identifying areas for cost improvement. Without this, they would have to measure the impact of the loading variance and product mix variance between actual and budgeted prior to make any decision on cost improvement. Cost per Equivalent Wafer Out, thereby, increases efficiency in wafer fab operational cost monitoring and controlling.
},
	    journal   = {International Journal of Electronics and Communication Engineering},
	  volume    = {4},
	  number    = {6},
	  year      = {2010},
	  pages     = {954 - 958},
	  ee        = {https://publications.waset.org/pdf/216},
	  url   	= {https://publications.waset.org/vol/42},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 42, 2010},
	}