@article{(Open Science Index):https://publications.waset.org/pdf/17356,
	  title     = {Reduction of Leakage Power in Digital Logic Circuits Using Stacking Technique in 45 Nanometer Regime},
	  author    = {P.K. Sharma and  B. Bhargava and  S. Akashe},
	  country	= {},
	  institution	= {},
	  abstract     = {Power dissipation due to leakage current in the digital circuits is a biggest factor which is considered specially while designing nanoscale circuits. This paper is exploring the ideas of reducing leakage current in static CMOS circuits by stacking the transistors in increasing numbers. Clearly it means that the stacking of OFF transistors in large numbers result a significant reduction in power dissipation. Increase in source voltage of NMOS transistor minimizes the leakage current. Thus stacking technique makes circuit with minimum power dissipation losses due to leakage current. Also some of digital circuits such as full adder, D flip flop and 6T SRAM have been simulated in this paper, with the application of reduction technique on ‘cadence virtuoso tool’ using specter at 45nm technology with supply voltage 0.7V.
},
	    journal   = {International Journal of Electronics and Communication Engineering},
	  volume    = {7},
	  number    = {1},
	  year      = {2013},
	  pages     = {60 - 65},
	  ee        = {https://publications.waset.org/pdf/17356},
	  url   	= {https://publications.waset.org/vol/73},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 73, 2013},
	}