WASET
    Somayeh Gholami and  Meysam Khakbaz,  Measurement of I-V Characteristics of a PtSi/p-Si Schottky Barrier Diode at low Temperatures.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    September 2011, vol. 57(9). 1285 - 1288
    [viewed 28 March 2024]. Available from: https://publications.waset.org/pdf/15885.