WASET
    Suma. V. and  T. R. Gopalakrishnan Nair,  Effective Defect Prevention Approach in Software Process for Achieving Better Quality Levels.   journal   = {International Journal of Industrial and Manufacturing Engineering}, [online]. World Academy of Science, Engineering and Technology.
    June 2008, vol. 18(6). 662 - 666
    [viewed 19 April 2024]. Available from: https://publications.waset.org/pdf/15871.