WASET
    Chang Soo Kang and  In Ho Im and  Sergey Churayev and  Timour Paltashev,  Phase Error Accumulation Methodology for On-Chip Cell Characterization.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    July 2011, vol. 55(7). 797 - 800
    [viewed 23 April 2024]. Available from: https://publications.waset.org/pdf/15803.