Watcharin Kaewapichai and Pakorn Kaewtrakulpong, Robust Ellipse Detection by Fitting Randomly Selected Edge Patches. journal = {International Journal of Computer and Information Engineering}, [online]. World Academy of Science, Engineering and Technology. December 2008, vol. 24(12). 4018 - 4021 [viewed 19 April 2024]. Available from: https://publications.waset.org/pdf/14384.