WASET
    Watcharin Kaewapichai and  Pakorn Kaewtrakulpong,  Robust Ellipse Detection by Fitting Randomly Selected Edge Patches.   journal   = {International Journal of Computer and Information Engineering}, [online]. World Academy of Science, Engineering and Technology.
    December 2008, vol. 24(12). 4018 - 4021
    [viewed 19 April 2024]. Available from: https://publications.waset.org/pdf/14384.