@article{(Open Science Index):https://publications.waset.org/pdf/14384,
	  title     = {Robust Ellipse Detection by Fitting Randomly Selected Edge Patches},
	  author    = {Watcharin Kaewapichai and  Pakorn Kaewtrakulpong},
	  country	= {},
	  institution	= {},
	  abstract     = {In this paper, a method to detect multiple ellipses is presented. The technique is efficient and robust against incomplete ellipses due to partial occlusion, noise or missing edges and outliers. It is an iterative technique that finds and removes the best ellipse until no reasonable ellipse is found. At each run, the best ellipse is extracted from randomly selected edge patches, its fitness calculated and compared to a fitness threshold. RANSAC algorithm is applied as a sampling process together with the Direct Least Square fitting of ellipses (DLS) as the fitting algorithm. In our experiment, the method performs very well and is robust against noise and spurious edges on both synthetic and real-world image data.
},
	    journal   = {International Journal of Computer and Information Engineering},
	  volume    = {2},
	  number    = {12},
	  year      = {2008},
	  pages     = {4018 - 4021},
	  ee        = {https://publications.waset.org/pdf/14384},
	  url   	= {https://publications.waset.org/vol/24},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 24, 2008},
	}