WASET
	@article{(Open Science Index):https://publications.waset.org/pdf/14248,
	  title     = {Reliable Face Alignment Using Two-Stage AAM},
	  author    = {Sunho Ki and  Daehwan Kim and  Seongwon Cho and  Sun-Tae Chung and  Jaemin Kim and  Yun-Kwang Hong and  Chang Joon Park and  Dongmin Kwon and  Minhee Kang and  Yusung Kim and  Younghan Yoon},
	  country	= {},
	  institution	= {},
	  abstract     = {AAM (active appearance model) has been successfully
applied to face and facial feature localization. However, its performance is sensitive to initial parameter values. In this paper, we propose a two-stage AAM for robust face alignment, which first fits an
inner face-AAM model to the inner facial feature points of the face and then localizes the whole face and facial features by optimizing the
whole face-AAM model parameters. Experiments show that the proposed face alignment method using two-stage AAM is more reliable to the background and the head pose than the standard
AAM-based face alignment method.},
	    journal   = {International Journal of Computer and Information Engineering},
	  volume    = {2},
	  number    = {5},
	  year      = {2008},
	  pages     = {1682 - 1686},
	  ee        = {https://publications.waset.org/pdf/14248},
	  url   	= {https://publications.waset.org/vol/17},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 17, 2008},
	}