TY - JFULL AU - Y. K. Chen and K. C. Chiou and C. Y. Chen PY - 2009/6/ TI - A Markov Chain Approximation for ATS Modeling for the Variable Sampling Interval CCC Control Charts T2 - International Journal of Computer and Information Engineering SP - 1247 EP - 1251 VL - 3 SN - 1307-6892 UR - https://publications.waset.org/pdf/13236 PU - World Academy of Science, Engineering and Technology NX - Open Science Index 29, 2009 N2 - The cumulative conformance count (CCC) charts are widespread in process monitoring of high-yield manufacturing. Recently, it is found the use of variable sampling interval (VSI) scheme could further enhance the efficiency of the standard CCC charts. The average time to signal (ATS) a shift in defect rate has become traditional measure of efficiency of a chart with the VSI scheme. Determining the ATS is frequently a difficult and tedious task. A simple method based on a finite Markov Chain approach for modeling the ATS is developed. In addition, numerical results are given. ER -