%0 Journal Article
	%A Y. K. Chen and  K. C. Chiou and  C. Y. Chen
	%D 2009
	%J International Journal of Computer and Information Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 29, 2009
	%T A Markov Chain Approximation for ATS Modeling for the Variable Sampling Interval CCC Control Charts
	%U https://publications.waset.org/pdf/13236
	%V 29
	%X The cumulative conformance count (CCC) charts are
widespread in process monitoring of high-yield manufacturing.
Recently, it is found the use of variable sampling interval (VSI)
scheme could further enhance the efficiency of the standard CCC
charts. The average time to signal (ATS) a shift in defect rate has
become traditional measure of efficiency of a chart with the VSI
scheme. Determining the ATS is frequently a difficult and tedious
task. A simple method based on a finite Markov Chain approach for
modeling the ATS is developed. In addition, numerical results are
given.
	%P 1248 - 1251