%0 Journal Article %A Y. K. Chen and K. C. Chiou and C. Y. Chen %D 2009 %J International Journal of Computer and Information Engineering %B World Academy of Science, Engineering and Technology %I Open Science Index 29, 2009 %T A Markov Chain Approximation for ATS Modeling for the Variable Sampling Interval CCC Control Charts %U https://publications.waset.org/pdf/13236 %V 29 %X The cumulative conformance count (CCC) charts are widespread in process monitoring of high-yield manufacturing. Recently, it is found the use of variable sampling interval (VSI) scheme could further enhance the efficiency of the standard CCC charts. The average time to signal (ATS) a shift in defect rate has become traditional measure of efficiency of a chart with the VSI scheme. Determining the ATS is frequently a difficult and tedious task. A simple method based on a finite Markov Chain approach for modeling the ATS is developed. In addition, numerical results are given. %P 1248 - 1251