@article{(Open Science Index):https://publications.waset.org/pdf/13236,
	  title     = {A Markov Chain Approximation for ATS Modeling for the Variable Sampling Interval CCC Control Charts},
	  author    = {Y. K. Chen and  K. C. Chiou and  C. Y. Chen},
	  country	= {},
	  institution	= {},
	  abstract     = {The cumulative conformance count (CCC) charts are
widespread in process monitoring of high-yield manufacturing.
Recently, it is found the use of variable sampling interval (VSI)
scheme could further enhance the efficiency of the standard CCC
charts. The average time to signal (ATS) a shift in defect rate has
become traditional measure of efficiency of a chart with the VSI
scheme. Determining the ATS is frequently a difficult and tedious
task. A simple method based on a finite Markov Chain approach for
modeling the ATS is developed. In addition, numerical results are
	    journal   = {International Journal of Computer and Information Engineering},
	  volume    = {3},
	  number    = {5},
	  year      = {2009},
	  pages     = {1248 - 1251},
	  ee        = {https://publications.waset.org/pdf/13236},
	  url   	= {https://publications.waset.org/vol/29},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 29, 2009},