Muhibul Haque Bhuyan and  Farseem Mannan Mohammedy and Quazi Deen Mohd Khosru,  Doping Profile Measurement and Characterization by Scanning Capacitance Microscope for PocketImplanted Nano Scale n-MOSFET.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    August 2011, vol. 56(8). 1082 - 1089
    [viewed 16 April 2024]. Available from: https://publications.waset.org/pdf/12190.