Paniz Tafakori and Ali A. Orouji, Investigation of Multiple Material Gate Impact on Short Channel Effects and Reliability of Nanoscale SOI MOSFETs. journal = {International Journal of Electrical and Computer Engineering}, [online]. World Academy of Science, Engineering and Technology. February 2013, vol. 74(2). 128 - 131 [viewed 11 May 2024]. Available from: https://publications.waset.org/pdf/11808.