Paniz Tafakori and  Ali A. Orouji,  Investigation of Multiple Material Gate Impact on Short Channel Effects and Reliability of Nanoscale SOI MOSFETs.   journal   = {International Journal of Electrical and Computer Engineering}, [online]. World Academy of Science, Engineering and Technology.
    February 2013, vol. 74(2). 128 - 131
    [viewed 18 October 2019]. Available from: https://publications.waset.org/pdf/11808.