Abdelaziz Guerrouat and Harald Richter
Adaptation of StateTransitionBased Methods for Embedded System Testing
3185 - 3191
2007
1
10
International Journal of Computer and Systems Engineering
https://publications.waset.org/pdf/10899
https://publications.waset.org/vol/10
World Academy of Science, Engineering and Technology
In this paper test generation methods and appropriate fault models for testing and analysis of embedded systems described as (extended) finite state machines ((E)FSMs) are presented. Compared to simple FSMs, EFSMs specify not only the control flow but also the data flow. Thus, we define a twolevel fault model to cover both aspects. The goal of this paper is to reuse wellknown FSMbased test generation methods for automation of embedded system testing. These methods have been widely used in testing and validation of protocols and communicating systems. In particular, (E)FSMsbased specification and testing is more advantageous because (E)FSMs support the formal semantic of already standardised formal description techniques (FDTs) despite of their popularity in the design of hardware and software systems.
Open Science Index 10, 2007