@article{(Open Science Index):https://publications.waset.org/pdf/10628,
	  title     = {Bias Stability of a-IGZO TFT and a new Shift-Register Design Suitable for a-IGZO TFT},
	  author    = {Young Wook Lee and  Sun-Jae Kim and  Soo-Yeon Lee and  Moon-Kyu Song and  Woo-Geun Lee Min-Koo Han},
	  country	= {},
	  institution	= {},
	  abstract     = {We have fabricated a-IGZO TFT and investigated the
stability under positive DC and AC bias stress. The threshold voltage
of a-IGZO TFT shifts positively under those biases, and that reduces
on-current. For this reason, conventional shift-register circuit
employing TFTs which stressed by positive bias will be unstable, may
do not work properly. We have designed a new 6-transistor
shift-register, which has less transistors than prior circuits. The TFTs
of the proposed shift-register are not suffering from positive DC or AC
stress, mainly kept unbiased. Despite the compact design, the stable
output signal was verified through the SPICE simulation even under
RC delay of clock signal.},
	    journal   = {International Journal of Electrical and Computer Engineering},
	  volume    = {5},
	  number    = {4},
	  year      = {2011},
	  pages     = {568 - 571},
	  ee        = {https://publications.waset.org/pdf/10628},
	  url   	= {https://publications.waset.org/vol/52},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 52, 2011},
	}