Muhibul Haque Bhuyan,  Impact of Gate Insulation Material and Thickness on Pocket Implanted MOS Device.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    March 2021, vol. 172(4). 128 - 136
    [viewed 26 April 2024]. Available from: https://publications.waset.org/pdf/10011953.