WASET
    M. Fadlallah and  G. Ghibaudo and  C. G. Theodorou,  Dynamic Variation in Nano-Scale CMOS SRAM Cells Due to LF/RTS Noise and Threshold Voltage .   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    June 2018, vol. 139(7). 506 - 509
    [viewed 25 April 2024]. Available from: https://publications.waset.org/pdf/10009262.