R. Meier and  M. Pander,  Methods for Material and Process Monitoring by Characterization of (Second and Third Order) Elastic Properties with Lamb Waves .   journal   = {International Journal of Physical and Mathematical Sciences}, [online]. World Academy of Science, Engineering and Technology.
    July 2017, vol. 128(8). 390 - 396
    [viewed 08 May 2021]. Available from: https://publications.waset.org/pdf/10007815.