WASET
    Chi-Yan Chu and  Kai-Chi Chuang and  Huang-Chung Cheng,  Resistive Switching Characteristics of Resistive Random Access Memory Devices after Furnace Annealing Processes.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    June 2017, vol. 128(8). 947 - 950
    [viewed 27 April 2024]. Available from: https://publications.waset.org/pdf/10007672.