Jun Sung Go and Jong Kang Park and Jong Tae Kim , Single Event Transient Tolerance Analysis in 8051 Microprocessor Using Scan Chain. journal = {International Journal of Electrical and Computer Engineering}, [online]. World Academy of Science, Engineering and Technology. November 2017, vol. 121(1). 51 - 54 [viewed 18 April 2024]. Available from: https://publications.waset.org/pdf/10006123.