Aïssa Manallah and  Mohamed Bouafia,  Determination of Optical Constants of Semiconductor Thin Films by Ellipsometry.   journal   = {International Journal of Materials and Metallurgical Engineering}, [online]. World Academy of Science, Engineering and Technology.
    June 2016, vol. 115(7). 927 - 930
    [viewed 04 May 2024]. Available from: https://publications.waset.org/pdf/10005029.