{"title":"Simulation of Hamming Coding and Decoding for Microcontroller Radiation Hardening","authors":"Rehab I. Abdul Rahman, Mazhar B. Tayel","volume":98,"journal":"International Journal of Electrical and Information Engineering","pagesStart":209,"pagesEnd":215,"ISSN":"1307-6892","URL":"https:\/\/publications.waset.org\/pdf\/10000673","abstract":"
This paper presents a method of hardening the 8051
\r\nmicro-controller, able to assure reliable operation in the presence of
\r\nbit flips caused by radiation. Aiming at avoiding such faults in the
\r\n8051 micro-controller, Hamming code protection was used in its
\r\nSRAM memory and registers. A VHDL code has been used for this
\r\nhamming code protection.<\/p>\r\n","references":"[1] http:\/\/ebookbrowsee.net\/lima-mapld00-pdf-d42419909\r\n[2] Ma, T.; Dressendorfer, P. Ionizing Radiation Effects in MOS Devices\r\nand Circuits, Wiley Eds, New York, 1989.\r\n[3] Normand, E. Single Event Upsets at Ground level.In: IEEE Transactions\r\non Nuclear Science, vol. 43, no.6, Dec, 1996.\r\n[4] Cota, E.; Carro, L.; Lubaszewski, M.;Velazco, R.; Rezgui, S. Synthesis\r\nof 8051-like Microcontroller Tolerant to Transient Faults. In: 1st IEEE\r\nLatin America Test Workshop (LATW), Brazil,2000.21\r\n[5] Velazco, R; Rezgui, S.; Cheynet, Ph.; Bofill,A.; Ecoffet, R. Thesic: A\r\ntestbed suitable for the qualification of integrated circuits devoted to\r\noperate in harsh environment, IEEE European Test Workshop (ETW\u201998)\r\npp. 89-90, 27-29 Mai 1998, Spain.26\r\n[6] Kohavi, Z. Switching and Finite Automata Theory, McGraw-Hill,\r\n1970.25","publisher":"World Academy of Science, Engineering and Technology","index":"Open Science Index 98, 2015"}