%0 Journal Article
	%A Bing-Jing Li and  Sih-Yin Wang and  Tse-Chun Yeh and  Yuan-Bin Chen
	%D 2014
	%J International Journal of Electronics and Communication Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 92, 2014
	%T Ultra-Low Loss Dielectric Properties of (Mg1-xNix)2(Ti0.95Sn0.05)O4 Microwave Ceramics
	%U https://publications.waset.org/pdf/9999041
	%V 92
	%X Microwave dielectric ceramic materials of
(Mg1-xNix)2(Ti0.95Sn0.05)O4 for x = 0.01, 0.03, 0.05, 0.07 and 0.09 were
prepared and sintered at 1250–1400 ºC. The microstructure and
microwave dielectric properties of the ceramic materials were
examined and measured. The observations shows that the content of
Ni2+ ions has little effect on the crystal structure, dielectric constant,
temperature coefficient of resonant frequency (τf) and sintering
temperatures of the ceramics. However, the quality values (Q×f) are
greatly improved due to the addition of Ni2+ ions. The present study
showed that the ceramic material prepared for x = 0.05 and sintered at
1325ºC had the best Q×f value of 392,000 GHz, about 23%
improvement compared with that of Mg2(Ti0.95Sn0.05)O4.

	%P 788 - 790