%0 Journal Article %A N. Dahbi and D-E. Arafah %D 2014 %J International Journal of Materials and Metallurgical Engineering %B World Academy of Science, Engineering and Technology %I Open Science Index 85, 2014 %T RBS Characteristic of Cd1−xZnxS Thin Film Fabricated by Vacuum Deposition Method %U https://publications.waset.org/pdf/9997254 %V 85 %X Cd1−xZnxS thins films have been fabricated from ZnS/CdS/ZnS multilayer thin film systems, by using the vacuum deposition method; the Rutherford backscattering (RBS) technique have been applied in order to determine the: structure, composition, depth profile, and stoichiometric of these films. The influence of the chemical and heat treatments on the produced films also have been investigated; the RBS spectra of the films showed that homogenous Cd1−xZnxS can be synthesized with x=0.45. %P 66 - 69