@article{(Open Science Index):https://publications.waset.org/pdf/9997254, title = {RBS Characteristic of Cd1−xZnxS Thin Film Fabricated by Vacuum Deposition Method}, author = {N. Dahbi and D-E. Arafah}, country = {}, institution = {}, abstract = {Cd1−xZnxS thins films have been fabricated from ZnS/CdS/ZnS multilayer thin film systems, by using the vacuum deposition method; the Rutherford backscattering (RBS) technique have been applied in order to determine the: structure, composition, depth profile, and stoichiometric of these films. The influence of the chemical and heat treatments on the produced films also have been investigated; the RBS spectra of the films showed that homogenous Cd1−xZnxS can be synthesized with x=0.45. }, journal = {International Journal of Materials and Metallurgical Engineering}, volume = {8}, number = {1}, year = {2014}, pages = {66 - 69}, ee = {https://publications.waset.org/pdf/9997254}, url = {https://publications.waset.org/vol/85}, bibsource = {https://publications.waset.org/}, issn = {eISSN: 1307-6892}, publisher = {World Academy of Science, Engineering and Technology}, index = {Open Science Index 85, 2014}, }