G. Ait Abdelmalek and R. Ziani, Design for Reliability and Manufacturing Yield (Study and Modeling of Defects in Integrated Circuits for their Reliability Analysis). journal = {International Journal of Industrial and Manufacturing Engineering}, [online]. World Academy of Science, Engineering and Technology. November 2012, vol. 71(11). 2496 - 2499 [viewed 20 September 2024]. Available from: https://publications.waset.org/pdf/9396.