WASET
    Wook-Won Kim and  Sung-Yul Kim and  Jin-O Kim,  SFCL Location Selection Considering Reliability Indices.   journal   = {International Journal of Electrical and Computer Engineering}, [online]. World Academy of Science, Engineering and Technology.
    September 2010, vol. 45(9). 1347 - 1351
    [viewed 24 April 2024]. Available from: https://publications.waset.org/pdf/8226.