%0 Journal Article %A Y. Bentoutou and A.M. Si Mohammed %D 2012 %J International Journal of Physical and Mathematical Sciences %B World Academy of Science, Engineering and Technology %I Open Science Index 66, 2012 %T A Review of in-orbit Observations of Radiation- Induced Effects in Commercial Memories onboard Alsat-1 %U https://publications.waset.org/pdf/8200 %V 66 %X This paper presents a review of an 8-year study on radiation effects in commercial memory devices operating within the main on-board computer system OBC386 of the Algerian microsatellite Alsat-1. A statistical analysis of single-event upset (SEU) and multiple-bit upset (MBU) activity in these commercial memories shows that the typical SEU rate at alsat-1's orbit is 4.04 × 10-7 SEU/bit/day, where 98.6% of these SEUs cause single-bit errors, 1.22% cause double-byte errors, and the remaining SEUs result in multiple-bit and severe errors. %P 652 - 654