WASET
	@article{(Open Science Index):https://publications.waset.org/pdf/8200,
	  title     = {A Review of in-orbit Observations of Radiation- Induced Effects in Commercial Memories onboard Alsat-1},
	  author    = {Y. Bentoutou and  A.M. Si Mohammed},
	  country	= {},
	  institution	= {},
	  abstract     = {This paper presents a review of an 8-year study on radiation effects in commercial memory devices operating within the main on-board computer system OBC386 of the Algerian microsatellite Alsat-1. A statistical analysis of single-event upset (SEU) and multiple-bit upset (MBU) activity in these commercial memories shows that the typical SEU rate at alsat-1's orbit is 4.04 × 10-7 SEU/bit/day, where 98.6% of these SEUs cause single-bit errors, 1.22% cause double-byte errors, and the remaining SEUs result in multiple-bit and severe errors.
},
	    journal   = {International Journal of Physical and Mathematical Sciences},
	  volume    = {6},
	  number    = {6},
	  year      = {2012},
	  pages     = {652 - 654},
	  ee        = {https://publications.waset.org/pdf/8200},
	  url   	= {https://publications.waset.org/vol/66},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 66, 2012},
	}