@article{(Open Science Index):https://publications.waset.org/pdf/8200, title = {A Review of in-orbit Observations of Radiation- Induced Effects in Commercial Memories onboard Alsat-1}, author = {Y. Bentoutou and A.M. Si Mohammed}, country = {}, institution = {}, abstract = {This paper presents a review of an 8-year study on radiation effects in commercial memory devices operating within the main on-board computer system OBC386 of the Algerian microsatellite Alsat-1. A statistical analysis of single-event upset (SEU) and multiple-bit upset (MBU) activity in these commercial memories shows that the typical SEU rate at alsat-1's orbit is 4.04 × 10-7 SEU/bit/day, where 98.6% of these SEUs cause single-bit errors, 1.22% cause double-byte errors, and the remaining SEUs result in multiple-bit and severe errors. }, journal = {International Journal of Physical and Mathematical Sciences}, volume = {6}, number = {6}, year = {2012}, pages = {652 - 654}, ee = {https://publications.waset.org/pdf/8200}, url = {https://publications.waset.org/vol/66}, bibsource = {https://publications.waset.org/}, issn = {eISSN: 1307-6892}, publisher = {World Academy of Science, Engineering and Technology}, index = {Open Science Index 66, 2012}, }