Kyoung Kun Lee and Soongyu Kwon and Jong Tae Kim, An Embedded System Design for SRAM SEU Test. journal = {International Journal of Computer and Information Engineering}, [online]. World Academy of Science, Engineering and Technology. December 2011, vol. 60(12). 1689 - 1692 [viewed 23 September 2024]. Available from: https://publications.waset.org/pdf/7770.